International Journal

Applied Logistic Regression

Authors

David W. Hosmer, Stanley A. Lemeshow

Journal

Wiley eBooks

Year Published

2000

Publisher

Wiley

Citations

20376 citations

Type

Book

Language

EN

Topics & Concepts

Logistic regression (0.71) Statistics (0.44)

Abstract

Applied Logistic Regression - Full text available via OpenAlex

Author Details

David W. Hosmer

Stanley A. Lemeshow

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