Applied Logistic Regression
Authors
David W. Hosmer, Stanley A. Lemeshow, Rodney X. Sturdivant
Journal
Wiley series in probability and statistics
Year Published
2013
Publisher
Wiley
Citations
13725 citations
Type
Book
Language
EN
Topics & Concepts
Abstract
Applied Logistic Regression - Full text available via OpenAlex
Author Details
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