Rich Feature Hierarchies for Accurate Object Detection and Semantic Segmentation
Authors
Ross Girshick, Jeff Donahue, Trevor J. Darrell, Jitendra Malik
Journal
IEEE Computer Society Conference on Computer Vision and Pattern Recognition/Proceedings - IEEE Computer Society Conference on Computer Vision and Pattern Recognition/Proceedings
Year Published
2014
Publisher
Institute of Electrical and Electronics Engineers
Citations
32120 citations
Type
Conference-Paper
Language
EN
Topics & Concepts
Abstract
Rich Feature Hierarchies for Accurate Object Detection and Semantic Segmentation - Full text available via OpenAlex
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